For citations:

Solov'ev A.N., Cherpakov A.V., Vasil’ev P.V., Parinov I.A., Kirillova E.V. Neural network technology for identifying defect sizes in half-plane based on time and positional scanning. Advanced Engineering Research (Rostov-on-Don). 2020;20(3):205-215. https://doi.org/10.23947/2687-1653-2020-20-3-205-215